Low-energy electron diffraction — (LEED) is a technique used to characterize the structures of surfaces.History =Davisson and Germer s discovery of electron diffraction= The development of electron diffraction was closely linked to the progress of quantum mechanics and atomic… … Wikipedia
Low-energy electron microscopy — Low energy electron microscopy, or LEEM, is a technique used by surface scientists to study surface structure at mesoscopic scale on conducting and semiconducting materials. It is based on imaging the electrons elastically scattered from the… … Wikipedia
Low-energy ion scattering — LEIS redirects here; for the Hawaiian garland see Lei (Hawaii). Low energy ion scattering spectroscopy (LEIS), sometimes referred to simply as ion scattering spectroscopy (ISS), is a surface sensitive analytical technique used to characterize the … Wikipedia
Scattering length — The scattering length in quantum mechanics describes low energy scattering. It is represented by the term a. General concept When a slow particle scatters off a short ranged scatterer (e.g. an impurity in a solid or a heavy particle) it cannot… … Wikipedia
Scattering from rough surfaces — Surface roughness scattering or interface roughness scattering is the elastic scattering of a charged particle by an imperfect interface between two different materials. It is an important effect in electronic devices which contain narrow layers … Wikipedia
Compton scattering — Light–matter interaction Low energy phenomena … Wikipedia
Helium atom scattering — (HAS) is a surface analysis technique used in materials science. HAS provides information about the surface structure and lattice dynamics of a material by measuring the diffracted atoms from a monochromatic helium beam incident on the sample.… … Wikipedia
Reflection high energy electron diffraction — (RHEED) is a technique used to characterize the surface of crystalline materials. RHEED systems gather information only from the surface layer of the sample, which distinguishes RHEED from other materials characterization methods that rely also… … Wikipedia
Carrier scattering — Defect types include atom vacancies, adatoms, steps, and kinks which occur most frequently at surfaces due to finite material size causing crystal discontinuity. What all types of defects have in common, whether they be surface or bulk, is that… … Wikipedia
High energy X-rays — or HEX rays are very hard X rays, with 80 keV 1000 keV typically one order of magnitude higher in energy than conventional X rays (and well into the gamma ray energies of over 120 keV). They are produced at modern synchrotron radiation sources… … Wikipedia
Electron energy loss spectroscopy — In electron energy loss spectroscopy (EELS) a material is exposed to a beam of electrons with a known, narrow range of kinetic energies. Some of the electrons will undergo inelastic scattering, which means that they lose energy and have their… … Wikipedia